報告題目：X-ray applications to materials science at the 3rd generation synchrotron radiation source PETRA III
報告人： Prof. Oliver H. Seeck（Deutsches Elektronen-Synchrotron DESY）
報告地點：Zoom會議室ID：931 4731 9556 密碼：chemuser（https://desy
The third-generation synchrotron radiation source PETRA III delivers bright X-ray beams mainly in the hard and high-energy X-ray range, enabling users to exploit the high brightness and coherence for in-situ and operando X-ray experiments. With its unique experimental capabilities, it serves more than 3000 international users each year from a wide spectrum of research fields in physics, chemistry, biology, materials, biomedical, and nanoscience, as well as cultural heritage. Many experiments are carried out under in-situ or operando conditions, making use of the superior coherence and focusing properties of the X-ray beams. Particularly for studies of materials e.g. for transport or for energy science X-ray methods are a very sensitive tool with sub-Angstrom microsecond resolution. This presention will be used to introduce methods of synchrotron radiation, based on the example of PETRA III, which are used to investigate samples from materials science. It will be shown, how X-ray methods help analysing texture, nano-strain, give insights in catalysis and battery research and outlooks to additive manufacturing.
Oliver Seeck is currently leader of the diffraction and scattering beamlines at the 3rd generation synchrotron generation source PETRA III atDESY in Hamburg, Germany. He recieved his PhD degree from University Kiel in Germany in 1997 and was thereafter Postdoc at the Advanced Photon Source in Argonne, USA. He continued as Scientist at Science Center Juelich in Germany being responsible for a Wiggler Beamline at the Synchrotron radiation source DORIS in Hamburg, DESY. in 2005, Oliver Seeck changed to DESY as beamline responsible for the High-Resolution Diffraction beamlines P08 at PETRA III and was later promoted as group leader. His research is focussed on soft matter thin films and liquid films in confinement. He have been authored two important monographs X-Ray Diffraction: Modern Experimental Techniques and “X-ray reflectometry and related surface near x-ray scattering methods”, as well as over 80 indexed papers in journals of PRL, JPCL, AFM, PNAS, ASC nano,etc.